Matrix Metrologies, Inc.
Street Address
101-5 Colin Dr.,
Holbrook,
NY,
11741,
United States of America
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Postal Address
101-5 Colin Dr.,
Holbrook,
NY,
11741,
United States of America
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Company Description
Distributor of film measurement equipment & services to determine the thickness & composition of metal depositions. Measurement equipment includes micro X-ray fluorescence (MXRF) analysis equipment, X-ray coating thickness measurement & material analysis system, indicators & gages. Features of micro X-ray fluorescence (MXRF) analysis equipment include vacuum option, configurable with mono or poly capillary lens & with beam & detector column solutions. Single, binary & ternary coating thickness applications can be measured precisely & non-destructively. Indicators use electrically cooled silicon pin-diode detector along with superior digital signal pulse processing. Element concentrations can be measured from parts per million levels to 100 percent. Analyzers are ideal for inspection of metal finished parts & electronic components. Industries served include metal finishing, microelectronics, telecommunications & semiconductor. Compliant with RoHS, ASTM & ISO 3497 specifications.
Products & Services
Misc. » - Capacitive Film Thickness Measuring Heads
- Coating Thickness Gage
- Coating Thickness Gauge
- Coating Thickness Meters
- Dry Film Thickness Gauge
- Film Thickness Gauge
- Hand Held Thickness Gauge
- Metal Thickness Gauge
- Metal Thickness Testing
- Plating Thickness Analysis
- Sheet Thickness Gauges
- Thickness Gage
- Thickness Gauge
- Wet Film Thickness Gauge
Control Systems & Accessories » Inspection and Testing » Measurement » Meters, Analysers & Monitors » Plating & Coatings » Sensors » Test & Measurement » Test, Commissioning & Maintenance » Thickness Measurement »
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Brand Name Products
No brand name products listed for Matrix Metrologies, Inc..
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