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High Performance Thermal Imaging Cameras at Photonex

Product News Friday, July 11, 2014: EngNet - Engineering Network

FLIR Systems has chosen the Photonex exhibition, being held at the Ricoh Arena, Coventry (UK) on 15th and 16th October 2014, to present its market-leading high performance thermal imaging camera range to the UK market. Visitors to Stand C17 will have the chance to discuss and see demonstrated FLIR Systems innovative X8400sc HD thermal imaging camera and the Ultra-fast X6580sc thermal imaging camera.

With a highly sensitive InSb detector, mega pixel resolution, advanced functionality, and cutting edge design, the FLIR X8400sc high definition camera sets a new standard for research and science thermography.  Providing high-definition images of 1280 x 1024 pixels the FLIR X8400sc thermal imaging cameras will reveal the faintest of thermal anomalies and allow you to see the smallest of details.  Incorporating advanced detector technology - FLIR SC8400 / SC6500 cameras can detect temperature differences smaller than 25mK (18mK typically). Using FLIR's proprietary "lock-in" facility, temperature differences as small as 1mK can be made clearly visible. Designed to unlock the secrets of almost any application a FLIR X8400sc camera can measure temperatures up to 3,000º C with an accuracy of +/- 1ºC or +/- 1%. The FLIR X8400sc offer an adjustable frame rate of up to 100 Hz full frame and can deliver images up to a speed of 3,000 Hz.

The FLIR X6580sc thermal imaging camera provides ultra-fast frame-rate acquisition for scientific and research applications involving dynamic thermal events. The device features a 640 × 512 digital InSb detector with spectral sensitivity from 1.5 to 5.5 µm and a f/3 aperture. It provides images up to 125 Hz in full frame and up to 4011 Hz in a 64 × 8 subwindowing mode. Features on this research grade camera include high thermal sensitivity, snapshot imagery, a motorised spectral filter wheel and a detachable touch-screen LCD. The camera connects to the company’s ResearchIR Max R&D software for thermal imaging data acquisition, analysis and reporting.  The X6580sc can be temperature-calibrated up to 300 °C, or up to 3000 °C with spectral and/or neutral density filters, and it provides measurement accuracy of ±1 °C for standard configurations.